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Piezo Flexure Nanopositioning Stages and Scanners For Surface Metrology & Nanolithography
Nanopositioning and scanning systems with frictionless flexure guidance are decidedly superior to positioners with conventional guiding ...
(12/01/2008, PI (Physik Instrumente) L.P. Piezo Nano Positioning)
New Encapsulated Piezo Actuators for High-Reliability Applications in the Semiconductor Industry
The reliability of piezoelectric multilayer actuators is an important issue for industrial 24/7 applications. Two completely different ...
(12/01/2008, PI (Physik Instrumente) L.P. Piezo Nano Positioning)
Sub-Nanometer Precision Hybrid Positioning Systems for Vertical Inspection Tools in Nanotechnology and Semiconductors
Improvement in the accuracy of motion control tools for nanotechnology can be achieved with adaptronic design principals and integration ...
(12/01/2008, PI (Physik Instrumente) L.P. Piezo Nano Positioning)

Recently Added White Papers

New Encapsulated Piezo Actuators for High-Reliability Applications in the Semiconductor Industry
The reliability of piezoelectric multilayer actuators is an important issue for industrial 24/7 applications. Two completely different load cases have to be distinguished when reliability ...
(12/01/2008, PI (Physik Instrumente) L.P. Piezo Nano Positioning)
Piezo Flexure Nanopositioning Stages and Scanners For Surface Metrology & Nanolithography
Nanopositioning and scanning systems with frictionless flexure guidance are decidedly superior to positioners with conventional guiding systems (crossed roller bearings, etc.) in terms ...
(12/01/2008, PI (Physik Instrumente) L.P. Piezo Nano Positioning)
Sub-Nanometer Precision Hybrid Positioning Systems for Vertical Inspection Tools in Nanotechnology and Semiconductors
Improvement in the accuracy of motion control tools for nanotechnology can be achieved with adaptronic design principals and integration of piezo technology in the system design. Two ...
(12/01/2008, PI (Physik Instrumente) L.P. Piezo Nano Positioning)
S/TEM: TrueCrystal Combines With S/TEM Systems For Automated Strain Analysis with Less Stress
Strain engineering helps semiconductor manufacturers to maximize device performance at any given node size. Traditional stress analysis methods are limited in scope or require very ...
(12/01/2008, FEI Company)
FIB: Copper Milling Enables Thrifty Design-For-Edit ASIC Development
To maintain its leadership in industrial, automotive, networking, wireless and computer peripherals markets, Avago has developed a design-for-edit IC strategy for its ASIC Products ...
(12/01/2008, FEI Company)
Improving Image Quality: Reducing Drift Problems via Automated Data Acquisition and Averaging in a Cs-Corrected TEM
It's hard enough to optimize image quality - what do you do if the sample won't stay put? Extended exposure times can't improve image quality if there is a sample drift problem during ...
(12/01/2008, FEI Company)
New Microwave Concepts based on Carbon Nano Tubes
The paper discusses microwave-device concepts based on carbon nanotubes. First, the physical properties of the carbon nanotubes are briefly described. Then, field emission devices, ...
(10/21/2008, IEEE)
S/TEM Improvements Drive New Applications in Nanotechnology
Scientists in any industry know it is extremely important to see every critical detail. Through continuing improvements in electron imaging technology and advancements in high resolution ...
(09/18/2008, FEI Company)
Scanning Transmission Electron Microscopy for Critical Dimension Monitoring in Wafer Manufacturing
Consistent quality is essential in manufacturing of semiconductors and the production of magnetic heads for data storage devices. This article provides a thorough explanation of automated ...
(09/16/2008, FEI Company)
FEI Connectivity Solutions Deliver Ultimate Imaging with Ultimate Throughput
Today's technology world is fast moving, and speeding up time-to-data is essential to the development and monitoring of advanced semiconductor manufacturing processes. The "FEI Connectivity ...
(09/16/2008, FEI Company)
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